发明授权
- 专利标题： Testing pattern sensitive algorithms for semiconductor design
- 专利标题（中）： 用于半导体设计的测试模式敏感算法
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申请号： US11947254申请日： 2007-11-29
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公开(公告)号： US07685544B2公开(公告)日： 2010-03-23
- 发明人: David L. DeMaris , Timothy G. Dunham , William C. Leipold , Daniel N. Maynard , Michael E. Scaman , Shi Zhong
- 申请人： David L. DeMaris , Timothy G. Dunham , William C. Leipold , Daniel N. Maynard , Michael E. Scaman , Shi Zhong
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Hoffman Warnick LLC
- 代理商 Ryan K. Simmons
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
A computer program product for generating test patterns for a pattern sensitive algorithm. The program product includes code for extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.
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