Invention Grant
US07692179B2 Nanowire device with (111) vertical sidewalls and method of fabrication
失效
具有(111)垂直侧壁的纳米线器件和制造方法
- Patent Title: Nanowire device with (111) vertical sidewalls and method of fabrication
- Patent Title (中): 具有(111)垂直侧壁的纳米线器件和制造方法
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Application No.: US10888628Application Date: 2004-07-09
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Publication No.: US07692179B2Publication Date: 2010-04-06
- Inventor: M. Saif Islam , Yong Chen , Shih-Yuan Wang , R. Stanley Williams
- Applicant: M. Saif Islam , Yong Chen , Shih-Yuan Wang , R. Stanley Williams
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H01L29/06
- IPC: H01L29/06

Abstract:
A nano-scale device and method of fabrication provide a nanowire having (111) vertical sidewalls. The nano-scale device includes a semiconductor-on-insulator substrate polished in a [110] direction, the nanowire, and an electrical contact at opposite ends of the nanowire. The method includes wet etching a semiconductor layer of the semiconductor-on-insulator substrate to form the nanowire extending between a pair of islands in the semiconductor layer. The method further includes depositing an electrically conductive material on the pair of islands to form the electrical contacts. A nano-pn diode includes the nanowire as a first nano-electrode, a pn-junction vertically stacked on the nanowire, and a second nano-electrode on a (110) horizontal planar end of the pn-junction. The nano-pn diode may be fabricated in an array of the diodes on the semiconductor-on-insulator substrate.
Public/Granted literature
- US20060006463A1 Nanowire device with (111) vertical sidewalls and method of fabrication Public/Granted day:2006-01-12
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