Invention Grant
- Patent Title: Display substrate and method of testing the display substrate
- Patent Title (中): 显示基板和测试显示基板的方法
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Application No.: US11563248Application Date: 2006-11-27
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Publication No.: US07692443B2Publication Date: 2010-04-06
- Inventor: Sang Jin Jeon
- Applicant: Sang Jin Jeon
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2005-0114641 20051129
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
A display substrate includes a plurality of gate lines, a plurality of data lines, a gate signal-inputting unit, a first test unit, and a first dummy switching unit. The gate lines extend in a first direction. The data lines extend in a second direction intersected with the first direction. The gate signal-inputting unit is formed at a first end of each of the gate lines to apply gate signals to the gate lines. The first test unit is formed at a second end of each of the gate lines opposite to the first end applying a first test signal to the gate lines. The first dummy switching unit is formed between the gate signal-inputting unit and the first test unit and transferring the first test signal to the gate lines.
Public/Granted literature
- US20070120790A1 DISPLAY SUBSTRATE AND METHOD OF TESTING THE DISPLAY SUBSTRATE Public/Granted day:2007-05-31
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