Invention Grant
- Patent Title: Light emitting diode based measurement systems
- Patent Title (中): 基于发光二极管的测量系统
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Application No.: US10896181Application Date: 2004-07-21
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Publication No.: US07692773B2Publication Date: 2010-04-06
- Inventor: Wayne D. Roth
- Applicant: Wayne D. Roth
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Agency: Daffer McDaniel, LLP
- Agent Charles D. Huston; Mollie E. Lettang
- Main IPC: G01P3/36
- IPC: G01P3/36

Abstract:
Various light emitting diode (LED) based measurement systems and methods are provided. One system includes one or more arrays of LEDs arranged along a flow path of a sample. The array(s) are configured to illuminate the sample as the sample moves along the flow path. The system also includes one or more detectors configured to detect light resulting from illumination of the sample by the array(s). One method includes illuminating a microsphere at different positions along a flow path of the microsphere. The method also includes detecting light resulting from the illumination to produce individual output signals corresponding to the illumination at the different positions. The method further includes combining the individual output signals to produce a single output signal having a signal-to-noise ratio that is greater than a signal-to-noise ratio of the individual output signals.
Public/Granted literature
- US20050030519A1 Light emitting diode based measurement systems Public/Granted day:2005-02-10
Information query
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