发明授权
US07695637B2 Slurry composition for chemical mechanical polishing and precursor composition thereof
有权
用于化学机械抛光的浆料组合物及其前体组合物
- 专利标题: Slurry composition for chemical mechanical polishing and precursor composition thereof
- 专利标题(中): 用于化学机械抛光的浆料组合物及其前体组合物
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申请号: US11615094申请日: 2006-12-22
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公开(公告)号: US07695637B2公开(公告)日: 2010-04-13
- 发明人: Tae Won Park , In Kyung Lee , Byoung Ho Choi
- 申请人: Tae Won Park , In Kyung Lee , Byoung Ho Choi
- 申请人地址: KR Gum-si
- 专利权人: Cheil Industries Inc.
- 当前专利权人: Cheil Industries Inc.
- 当前专利权人地址: KR Gum-si
- 代理机构: Summa, Additon & Ashe, P.A.
- 优先权: KR10-2006-0117367 20061127
- 主分类号: H01L21/302
- IPC分类号: H01L21/302
摘要:
Disclosed are a slurry composition for chemical mechanical polishing and a precursor composition thereof. The polishing slurry composition includes deionized water, abrasive particles, a pH-adjusting agent and a surfactant, wherein the surfactant includes two or more ionic moieties and two or more lipophilic groups. The polishing slurry composition can polish convex surfaces of a semiconductor having a step height at a higher rate than the polishing rate for concave surfaces acting as polishing stop layers of the semiconductor so that the polishing can be self-stopped, reduces the occurrence of surface defects after the polishing process, and has a high degree of polishing planarization and good dispersion stability.
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