Invention Grant
US07697127B2 Method and system for angle measurement 有权
角度测量方法和系统

Method and system for angle measurement
Abstract:
An angle measurement device includes a light source configured to emit light along an optical path and a patterned member positioned along the optical path and configured to rotate about an axis of rotation. The patterned member includes a periodic optical variation. Light passing through the patterned member provides a spatially modulated optical waveform. The angle measurement device also includes an imaging device positioned along the optical path and including a plurality of photosensitive elements disposed in an array configuration. The imaging device is configured to receive the spatially modulated optical waveform and provide a signal associated with light intensity at each of the plurality of photosensitive elements. The angle measurement device further includes an angle determination unit coupled to the imaging device and configured to compute a rotation angle of the patterned member based on a reference waveform and the provided signal.
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