Invention Grant
- Patent Title: Process measuring device with expanded hardware error detection
- Patent Title (中): 具有扩展硬件错误检测的过程测量设备
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Application No.: US10584302Application Date: 2004-12-15
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Publication No.: US07698609B2Publication Date: 2010-04-13
- Inventor: Robert Lalla , Axel Humpert , Jean Luc Gesser , Arno Goetz
- Applicant: Robert Lalla , Axel Humpert , Jean Luc Gesser , Arno Goetz
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE10361465 20031223
- International Application: PCT/EP2004/053514 WO 20041215
- International Announcement: WO2005/064424 WO 20050714
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F11/10 ; G06F3/00

Abstract:
A process measuring device including: A first processor, which performs a measured value processing with a first algorithm in first processing cycles; and a second processor, which is responsible for coordination and/or communication tasks. The second processor reads, in time intervals which are greater than the first processing cycle, a control data set from the first processor, and executes the first algorithm on the basis of the control data set, in order to verify the correct functioning of the first processor.
Public/Granted literature
- US20070273508A1 Process Measuring Device With Expanded Hardware Error Detection Public/Granted day:2007-11-29
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