Invention Grant
- Patent Title: Method and system to evaluate operational characteristics of an electronic circuit
- Patent Title (中): 评估电子电路运行特性的方法和系统
-
Application No.: US11747873Application Date: 2007-05-11
-
Publication No.: US07698669B1Publication Date: 2010-04-13
- Inventor: Daniel Tun Lai Chow
- Applicant: Daniel Tun Lai Chow
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Agency: Martine Penilla & Gencarella, LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
The present invention is directed to a method and a system to evaluate operational characteristics of an electronic circuit. The method includes generating a visual display, on a monitor, of an eye diagram viewer. The eye diagram viewer is used to establish a test parameter for the circuit. Accessed is data that includes a graphical file containing eye diagram information corresponding to the test parameter. A visually perceivable image of the eye diagram information is provided in response to the test parameter. Specifically, the eye diagram viewer is used to establish an eye diagram information identifier by displaying in a plurality of test condition selector screens one of a multiple condition values for the test condition parameters. The graphical file containing the eye diagram information corresponding to the eye diagram information identifier is obtained from the server and displayed.
Information query