发明授权
- 专利标题: Automatic inspection system for flat panel substrate
- 专利标题(中): 平板基板自动检测系统
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申请号: US11714513申请日: 2007-03-05
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公开(公告)号: US07714996B2公开(公告)日: 2010-05-11
- 发明人: Zheng Yan , Bo Li , Wayne Chen , Tony Young , Ning Li , Jianbo Gao
- 申请人: Zheng Yan , Bo Li , Wayne Chen , Tony Young , Ning Li , Jianbo Gao
- 申请人地址: US CA Santa Clara
- 专利权人: 3i Systems Corporation
- 当前专利权人: 3i Systems Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Courtney Staniford & Gregory LLP
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
Automatic optical inspection (AOI) systems are described comprising optical modules that include an illumination component and a lens array configured to direct illumination of the illumination component at a portion of a substrate. The lens array includes a Fresnel lens. The optical module includes a camera that receives reflected light resulting from an interaction of the illumination and the substrate. The camera includes a time delay integration (TDI) sensor. A telecentric imaging lens directs reflected light from the substrate to the camera. The illumination component comprises a controller coupled to multiple LED light sources, each emitting light at a different wavelength. The controller independently controls each LED light source. The illumination component includes a bright field and/or a dark field light source. The illumination component can include a front side and/or a back side light source. An optical fiber is coupled to the camera and an image processor.
公开/授权文献
- US20080174771A1 Automatic inspection system for flat panel substrate 公开/授权日:2008-07-24
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