发明授权
US07715214B2 Malfunction determining device for drive circuit and drive unit including the same, and method for determining malfunction in drive circuit
有权
用于驱动电路的故障确定装置和包括其的驱动单元以及用于确定驱动电路中的故障的方法
- 专利标题： Malfunction determining device for drive circuit and drive unit including the same, and method for determining malfunction in drive circuit
- 专利标题（中）： 用于驱动电路的故障确定装置和包括其的驱动单元以及用于确定驱动电路中的故障的方法
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申请号： US11884235申请日： 2006-03-02
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公开(公告)号： US07715214B2公开(公告)日： 2010-05-11
- 发明人: Takeshi Kishimoto , Masaya Amano , Nobuyuki Tanaka , Kouji Miyazaki
- 申请人： Takeshi Kishimoto , Masaya Amano , Nobuyuki Tanaka , Kouji Miyazaki
- 申请人地址： JP Toyota
- 专利权人： Toyota Jidosha Kabushiki Kaisha
- 当前专利权人： Toyota Jidosha Kabushiki Kaisha
- 当前专利权人地址： JP Toyota
- 代理机构： Oliff & Berridge, PLC
- 优先权： JP2005-058473 20050303; JP2006-022456 20060131
- 国际申请： PCT/IB2006/000446 WO 20060302
- 国际公布： WO2006/092715 WO 20060908
- 主分类号： H02M3/18
- IPC分类号： H02M3/18
摘要：
A device and method for determining whether a malfunction is present in a drive circuit, which drives an electric device that generates counter-electromotive force, when all gates in the switching elements of the drive circuit are blocked. After the gates are blocked, the temperature of the switching elements is monitored and the presence of a malfunction is determined based on the detected temperature of the switching elements. A malfunction is determined to be present when the detected temperature equals or exceeds a predetermined temperature; the change in the detected temperature equals or exceeds a predetermined value; or the rate of change in the detected temperature equals or exceeds than a predetermined rate. Thus, it can be appropriately determined whether the gates in the drive circuit are appropriately blocked and minimize the influence of any malfunctions on other elements outside of the drive circuit.
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