发明授权
- 专利标题: Infrared detection unit using a semiconductor optical lens
- 专利标题(中): 使用半导体光学透镜的红外检测单元
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申请号: US12094964申请日: 2006-11-24
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公开(公告)号: US07718970B2公开(公告)日: 2010-05-18
- 发明人: Yoshiaki Honda , Takayuki Nishikawa , Tomohiro Kamitsu
- 申请人: Yoshiaki Honda , Takayuki Nishikawa , Tomohiro Kamitsu
- 申请人地址: JP Osaka
- 专利权人: Panasonic Electric Works Co., Ltd.
- 当前专利权人: Panasonic Electric Works Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: Cheng Law Group, PLLC
- 优先权: JP2005-341213 20051125; JP2006-089602 20060328
- 国际申请: PCT/JP2006/324044 WO 20061124
- 国际公布: WO2007/061137 WO 20070531
- 主分类号: G01J5/02
- IPC分类号: G01J5/02
摘要:
An infrared detection unit includes a base carrying an infrared sensor element, and a cap configured to be fitted on the base to surround the infrared sensor element. The cap has a top wall with a window in which a semiconductor lens is fitted to collect an infrared radiation onto the infrared sensor element. The semiconductor optical lens is formed from a semiconductor substrate to have a convex lens and a flange which surround said convex lens. An infrared barrier is formed on the semiconductor lens to block the infrared radiation from passing through the boundary between the circumference of the convex lens and the window. Accordingly, the infrared sensor element can receive only the infrared radiation originating from a detection area intended by the convex lens.
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