发明授权
- 专利标题: Fabrication of germanium nanowire transistors
- 专利标题(中): 锗纳米线晶体管的制造
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申请号: US12006273申请日: 2007-12-31
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公开(公告)号: US07727830B2公开(公告)日: 2010-06-01
- 发明人: Been-Yih Jin , Jack T. Kavalieros , Matthew V. Metz , Marko Radosavlievic , Robert S. Chau
- 申请人: Been-Yih Jin , Jack T. Kavalieros , Matthew V. Metz , Marko Radosavlievic , Robert S. Chau
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Ryder, Lu, Mazzeo and Konieczny, LLC
- 代理商 Douglas J. Ryder
- 主分类号: H01L21/337
- IPC分类号: H01L21/337
摘要:
In general, in one aspect, a method includes using the Germanium nanowire as building block for high performance logic, memory and low dimensional quantum effect devices. The Germanium nanowire channel and the SiGe anchoring regions are formed simultaneously through preferential Si oxidation of epitaxial Silicon Germanium epi layer. The placement of the germanium nanowires is accomplished using a Si fin as a template and the germanium nanowire is held on Si substrate through SiGe anchors created by masking the two ends of the fins. High dielectric constant gate oxide and work function metals wrap around the Germanium nanowire for gate-all-around electrostatic channel on/off control, while the Germanium nanowire provides high carrier mobility in the transistor channel region. The germanium nanowire transistors enable high performance, low voltage (low power consumption) operation of logic and memory devices.
公开/授权文献
- US20090170251A1 Fabrication of germanium nanowire transistors 公开/授权日:2009-07-02
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