发明授权
- 专利标题: Semiconductor device
- 专利标题(中): 半导体器件
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申请号: US11864041申请日: 2007-09-28
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公开(公告)号: US07732840B2公开(公告)日: 2010-06-08
- 发明人: Fumiyoshi Matsuoka , Yohji Watanabe , Ryo Fukuda
- 申请人: Fumiyoshi Matsuoka , Yohji Watanabe , Ryo Fukuda
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Turocy & Watson, LLP
- 优先权: JP2006-266142 20060929
- 主分类号: H01L21/76
- IPC分类号: H01L21/76
摘要:
A second-conductivity-type transistor includes a source and drain formed by a second-conductivity-type diffusion layer formed on a first-conductivity-type semiconductor layer; and a gate formed on the first-conductivity-type semiconductor layer sandwiched between the second-conductivity-type diffusion layer through an insulating film A first-conductivity-type transistor includes a source and drain formed by a first-conductivity-type diffusion layer formed on a second-conductivity-type semiconductor layer; and a gate formed on the second-conductivity-type semiconductor layer sandwiched between the first-conductivity-type diffusion layer through an insulating film. The second-conductivity-type diffusion layer for configuring the second-conductivity-type transistor is divided into a plurality of regions, each of which being separated by a device isolation region formed on the first-conductivity-type semiconductor layer. The first-conductivity-type diffusion layer for configuring the first-conductivity-type transistor is divided into a plurality of regions, each of which being separated by a device isolation region formed on the second-conductivity-type semiconductor layer.
公开/授权文献
- US20080079473A1 SEMICONDUCTOR DEVICE 公开/授权日:2008-04-03
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