发明授权
- 专利标题: Semiconductor device and operating method thereof
- 专利标题(中): 半导体器件及其操作方法
-
申请号: US12217002申请日: 2008-06-30
-
公开(公告)号: US07733141B2公开(公告)日: 2010-06-08
- 发明人: Young-Hoon Oh
- 申请人: Young-Hoon Oh
- 申请人地址: KR
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR
- 代理机构: Blakely, Sokoloff, Taylor & Zafman
- 优先权: KR10-2007-0111458 20071102; KR10-2008-0040893 20080430
- 主分类号: H03L7/06
- IPC分类号: H03L7/06
摘要:
A delay locked loop (DLL) of a semiconductor device has a relatively small area and low current consumption while having a function of correcting a duty ratio. The semiconductor device includes a split unit configured to receive and split a reference clock to output a first clock corresponding to a first edge of the reference clock and a second clock corresponding to a second edge, a voltage generation unit configured to generate a first voltage corresponding to a duty ratio of the first clock and a second voltage corresponding to a duty ratio of the second clock, a voltage comparison unit configured to compare levels of the first and second voltages with each other, and a clock delay unit configured to receive one of the first and second clocks to delay the received clock of which delay amount is determined in response to an output signal of the voltage comparison unit.
公开/授权文献
- US20090115475A1 Semiconductor device and operating method thereof 公开/授权日:2009-05-07
信息查询