发明授权
- 专利标题： Method for evaluating DNA probes position on substrate
- 专利标题（中）： 评估DNA探针在底物上的位置的方法
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申请号： US11113195申请日： 2005-04-25
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公开(公告)号： US07734422B2公开(公告)日： 2010-06-08
- 发明人: Kazuhito Rokutan , Hiroyuki Tomita , Toshiro Saito
- 申请人： Kazuhito Rokutan , Hiroyuki Tomita , Toshiro Saito
- 申请人地址： JP Tokyo
- 专利权人： Hitachi High-Technologies Corporation
- 当前专利权人： Hitachi High-Technologies Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Stites & Harbison PLLC
- 代理商 Juan Carlos A. Marquez, Esq.
- 优先权： JP2001-053465 20010228; JP2002-022682 20020131
- 主分类号： G01N33/48
- IPC分类号： G01N33/48 ; G06F19/00 ; G01N31/00 ; C07H21/00 ; C07H21/04 ; C12Q1/68 ; C12P19/34 ; C12M1/00
摘要：
An oligonucleotide array comprising an array of multiple oligonucleotides with different base sequences fixed onto known and separate positions on a support substrate, wherein said oligonucleotides are biological stress related genes or complementary sequence chains to the said genes, and the said oligonucleotides are classified according to their gene functions, wherein the fixation region on the support substrate is divided into the said classification.
公开/授权文献
- US20050208561A1 Method for evaluating DNA probes position on substrate 公开/授权日：2005-09-22
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