Invention Grant
US07736588B2 Apparatus and method for detecting undesired residues in a sample
失效
用于检测样品中不希望的残留物的装置和方法
- Patent Title: Apparatus and method for detecting undesired residues in a sample
- Patent Title (中): 用于检测样品中不希望的残留物的装置和方法
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Application No.: US10492899Application Date: 2002-10-10
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Publication No.: US07736588B2Publication Date: 2010-06-15
- Inventor: Pieter Cornelis Langeveld , Karl Heinrich Van Hemert , Johannes Hendrik Pieter Machiel Kerkhof , Jacobus Stark
- Applicant: Pieter Cornelis Langeveld , Karl Heinrich Van Hemert , Johannes Hendrik Pieter Machiel Kerkhof , Jacobus Stark
- Applicant Address: NL Heerlen
- Assignee: DSM IP Assets B.V.
- Current Assignee: DSM IP Assets B.V.
- Current Assignee Address: NL Heerlen
- Agency: Nixon & Vanderhye P.C.
- Priority: EP01203936 20011015; EP02100496 20020515
- International Application: PCT/EP02/11369 WO 20021010
- International Announcement: WO03/033728 WO 20030424
- Main IPC: G01N33/02
- IPC: G01N33/02 ; C12Q1/18 ; G01J3/46

Abstract:
Detection arrangement and method for detecting presence of a residue in a sample include determining color values of the sample, associated with the L*a*b color model. A value of a composite parameter Z is calculated as follows: A=wL+waa+wbb where wL, wa and wb are weighting factors having a value depending on the residue and the sample. A determination is made whether or not the sample comprises more or less than a predetermined amount of the residue in dependence on the value of the composition parameter Z. In a preferred embodiment, the arrangement is used to detect antibiotic residues, e.g. penicillin-G, in food products, elg. Milk, or body fluids, e.g. blood, urine.
Public/Granted literature
- US20050014281A1 Apparatus and method for detecting undesired residues in a sample Public/Granted day:2005-01-20
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