发明授权
US07739225B2 Method and system to analyze aspect rules based on domain coverage of an aspect-value pair
有权
基于方面值对的域覆盖来分析方面规则的方法和系统
- 专利标题: Method and system to analyze aspect rules based on domain coverage of an aspect-value pair
- 专利标题(中): 基于方面值对的域覆盖来分析方面规则的方法和系统
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申请号: US11703511申请日: 2007-02-07
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公开(公告)号: US07739225B2公开(公告)日: 2010-06-15
- 发明人: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- 申请人: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- 申请人地址: US CA San Jose
- 专利权人: eBay Inc.
- 当前专利权人: eBay Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 主分类号: G06F17/00
- IPC分类号: G06F17/00 ; G06F7/00
摘要:
Methods and systems to analyze aspect rules based on domain coverage of aspect-value pairs are provided. The system receives a first plurality of data items from a database, applies a first plurality of rules to the first plurality of data items to generate a second plurality of data items associated with a first domain, counts the second plurality of data items to determine a total quantity of data items, applies a second plurality of rules to the second plurality of data items to identify a third plurality of data items it associates with a first aspect-value pair, counts the third plurality of data items to determine a first quantity of data items, determines a percentage of coverage for the first aspect-value pair based on the first quantity of data items and the total quantity of data items, and provides the percentage coverage for the first aspect-value pair as an interface element within an interface.
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