发明授权
US07739226B2 Method and system to analyze aspect rules based on domain coverage of the aspect rules
有权
基于方面规则的域覆盖方法和系统来分析方面规则
- 专利标题: Method and system to analyze aspect rules based on domain coverage of the aspect rules
- 专利标题(中): 基于方面规则的域覆盖方法和系统来分析方面规则
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申请号: US11703515申请日: 2007-02-07
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公开(公告)号: US07739226B2公开(公告)日: 2010-06-15
- 发明人: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- 申请人: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- 申请人地址: US CA San Jose
- 专利权人: eBay Inc.
- 当前专利权人: eBay Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 主分类号: G06F7/00
- IPC分类号: G06F7/00 ; G06F17/00
摘要:
Methods and systems to analyze aspect rules based on domain coverage of the aspect rules are provided. The system receives a first plurality of data items from a database, applies a first plurality of rules to the first plurality of data items to generate a second plurality of data items associated with a first domain, counts the second plurality of data items to determine a total quantity of data items, applies a second plurality of rules to the second plurality of data items to identify a third plurality of data items associated with a first aspect counts the third plurality of data items to determine a first quantity of data items, determines a percentage of coverage for the first aspect based on the first quantity of data items and the total quantity of data items, and provides the percentage of coverage as an interface element within an interface.
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