发明授权
- 专利标题: Measurement apparatus for improving performance of standard cell library
- 专利标题(中): 用于提高标准细胞库性能的测量装置
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申请号: US12145334申请日: 2008-06-24
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公开(公告)号: US07746183B2公开(公告)日: 2010-06-29
- 发明人: Seong-Heon Kim , Woo Chol Shin , Kyeong Soon Cho
- 申请人: Seong-Heon Kim , Woo Chol Shin , Kyeong Soon Cho
- 申请人地址: KR Seoul
- 专利权人: Dongbu HiTek Co., Ltd.
- 当前专利权人: Dongbu HiTek Co., Ltd.
- 当前专利权人地址: KR Seoul
- 代理机构: Sherr & Vaughn, PLLC
- 优先权: KR10-2007-0062702 20070626
- 主分类号: G01R23/00
- IPC分类号: G01R23/00
摘要:
Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator among various test element groups (TEGs). A built-in circuit is used to measure and verify performance of the standard cell library through a TEG. Therefore, it is possible to effectively improve performances of the standard cells in the standard cell library. Particularly, it is possible to not only remove human errors or internal errors of equipment, but also perform the measurement more readily, rapidly and accurately. Further, it is possible to curtail the use of high-performance equipment or manpower and time required in a measurement process.
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