公开(公告)号：US07746183B2

公开(公告)日：2010-06-29

申请号：US12145334

申请日：2008-06-24

申请人： Seong-Heon Kim ,  Woo Chol Shin ,  Kyeong Soon Cho

发明人： Seong-Heon Kim ,  Woo Chol Shin ,  Kyeong Soon Cho

IPC分类号： G01R23/00

CPC分类号： G01R31/318594 ,  H03K3/03

摘要： Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator among various test element groups (TEGs). A built-in circuit is used to measure and verify performance of the standard cell library through a TEG. Therefore, it is possible to effectively improve performances of the standard cells in the standard cell library. Particularly, it is possible to not only remove human errors or internal errors of equipment, but also perform the measurement more readily, rapidly and accurately. Further, it is possible to curtail the use of high-performance equipment or manpower and time required in a measurement process.

摘要翻译： 本文公开了一种用于在通过各种测试元件组（TEG）中的环形振荡器验证标准单元库的性能时，提高标准单元库中的标准单元的性能的测量装置。 内置电路用于通过TEG测量和验证标准单元库的性能。 因此，能够有效地提高标准单元库的标准单元的性能。 特别是，不仅可以消除设备的人为错误或内部错误，还可以更加快速，准确地进行测量。 此外，可以减少测量过程中所需的高性能设备或人力和时间的使用。