发明授权
US07746465B2 Sample holder for an optical element 有权
用于光学元件的样品架

Sample holder for an optical element
摘要:
The sample holder includes support having a thickness and an aperture through the thickness of the support. A tilt mechanism is connected to the support for controlled tilting of the support, and the aperture through the support is configured to have a diameter that increases in a direction through the thickness of the support. This arrangement enables a light beam to pass through the same given area of the sample, irrespective of whether the sample is held perpendicular to the beam or held at a tilted position relative to the beam. In one embodiment, the holder includes an efficient magnetic clamp mechanism for securing the sample to the holder. The holder compactly integrates with tilting mechanisms a sample rotation mechanism.
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