发明授权
- 专利标题: NOR and NAND memory arrangement of resistive memory elements
- 专利标题(中): NOR和NAND存储器布置的电阻存储器元件
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申请号: US11737236申请日: 2007-04-19
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公开(公告)号: US07746683B2公开(公告)日: 2010-06-29
- 发明人: Kurt Hoffmann , Christine Dehm , Recai Sezi , Andreas Walter
- 申请人: Kurt Hoffmann , Christine Dehm , Recai Sezi , Andreas Walter
- 申请人地址: DE Munich
- 专利权人: Qimonda AG
- 当前专利权人: Qimonda AG
- 当前专利权人地址: DE Munich
- 代理机构: Edell, Shapiro & Finnan, LLC
- 优先权: DE102004051152 20041020
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A memory arrangement includes: a first line for applying a reference voltage, a second line for applying an operating voltage, and a plurality of resistive memory elements, each element includes a resistive memory cell and a MOS memory cell selection transistor. A NOR memory arrangement is configured with each memory element including the resistive memory cell and selection transistor connected in series with the transistor connected to the first line, and the memory cell connected to the second line. A NAND memory arrangement is configured with a series of resistive memory elements forming a chain with each memory element including the resistive memory cell and selection transistor connected in parallel. The chain is connected to the first line disposed on a side of the memory cells facing the selection transistors and the second line disposed on a side of the memory cells which is remote from the selection transistors.
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