发明授权
- 专利标题: Elevated temperature RF ion source
- 专利标题(中): 高温RF离子源
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申请号: US12183787申请日: 2008-07-31
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公开(公告)号: US07750314B2公开(公告)日: 2010-07-06
- 发明人: William F. DiVergilio
- 申请人: William F. DiVergilio
- 申请人地址: US MA Beverly
- 专利权人: Axcelis Technologies, Inc.
- 当前专利权人: Axcelis Technologies, Inc.
- 当前专利权人地址: US MA Beverly
- 代理机构: Eschweiler & Associates, LLC
- 主分类号: H01J27/00
- IPC分类号: H01J27/00 ; H01T23/00
摘要:
An elevated temperature RF ion source system, comprising an ion source body, an RF antenna coil external to the ion source body, a vacuum enclosure surrounding both the outside surface of the ion source body and the RF antenna coil, at least one power supply, a gas delivery system operatively coupled to the ion source body, a vacuum condition between the outside surface of the ion source body and the RF antenna coil, the RF antenna coil operatively coupled to the at least one power supply, and a water cooling system operatively coupled to the RF antenna coil and the vacuum enclosure.
公开/授权文献
- US20090032727A1 ELEVATED TEMPERATURE RF ION SOURCE 公开/授权日:2009-02-05
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