发明授权
- 专利标题: Phase detector utilizing analog-to-digital converter components
- 专利标题(中): 相位检测器利用模数转换器组件
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申请号: US12039424申请日: 2008-02-28
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公开(公告)号: US07750831B2公开(公告)日: 2010-07-06
- 发明人: Heyon Min Bae , Naresh Ramnath Shanbhag , Andrew C. Singer , Jonathan B. Ashbrook
- 申请人: Heyon Min Bae , Naresh Ramnath Shanbhag , Andrew C. Singer , Jonathan B. Ashbrook
- 申请人地址: US CA Sunnyvale
- 专利权人: Finisar Corporation
- 当前专利权人: Finisar Corporation
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Workman Nydegger
- 主分类号: H03M1/00
- IPC分类号: H03M1/00
摘要:
Methods and systems are provided for an improved phase detector utilizing analog-to-digital converter (ADC) components. In an embodiment, the method includes from an ADC having a sampling clock signal that determines sampling instants, obtaining a first comparison value between an analog signal and a first threshold voltage at a first sampling instant, and obtaining a second comparison value between the analog signal and a second threshold voltage at a second sampling instant. The method further includes, from a supplemental circuit, obtaining a third comparison value between the analog signal and a third threshold voltage at a third sampling instant between the first and second sampling instants. The method further includes processing the first, second, and third comparison values to determine a phase relationship between the analog signal and the sampling clock.
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