Invention Grant
US07752589B2 Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design
失效
用于显示和修改集成电路设计的关键区域的方法，装置和计算机程序产品
- Patent Title: Method, apparatus, and computer program product for displaying and modifying the critical area of an integrated circuit design
- Patent Title (中): 用于显示和修改集成电路设计的关键区域的方法，装置和计算机程序产品
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Application No.: US11620059Application Date: 2007-01-05
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Publication No.: US07752589B2Publication Date: 2010-07-06
- Inventor: Robert J. Allen , Sarah C. Braasch , Matthew T. Guzowski , Jason D. Hibbeler , Daniel N. Maynard , Kevin W. McCullen , Evanthia Papadopoulou , Mervyn Y. Tan , Robert F. Walker
- Applicant: Robert J. Allen , Sarah C. Braasch , Matthew T. Guzowski , Jason D. Hibbeler , Daniel N. Maynard , Kevin W. McCullen , Evanthia Papadopoulou , Mervyn Y. Tan , Robert F. Walker
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ryan K. Simmons
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method, apparatus, and computer program product for visually indicating the interaction between one or more edges of a design that contribute to a defined critical area pattern.
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