发明授权
- 专利标题: Delay locked loop circuit and method
- 专利标题(中): 延时锁相环电路及方法
-
申请号: US12026155申请日: 2008-02-05
-
公开(公告)号: US07755404B2公开(公告)日: 2010-07-13
- 发明人: Feng Lin
- 申请人: Feng Lin
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 主分类号: H03L7/06
- IPC分类号: H03L7/06
摘要:
Delay locked loop circuits and methods are disclosed. In the embodiments, a delay locked loop may include a phase detector to detect a phase difference between a clock signal and a reference clock signal, and a charge pump that receives the detected phase difference. A low pass filter may filter an output from the charge pump. The delay locked loop may further include a delay line having a plurality of delay elements, the plurality of delay elements including a first selectable group and a second selectable group that is larger than the first selectable group. A first clock signal from the first group of delay elements may be provided to the phase detector to first synchronize the delay locked loop, and following the synchronization, a second clock signal from the second group may be employed to synchronize the delay locked loop.
公开/授权文献
- US20090195279A1 DELAY LOCKED LOOP CIRCUIT AND METHOD 公开/授权日:2009-08-06
信息查询