Invention Grant
- Patent Title: Substrate processing method and substrate processing apparatus
- Patent Title (中): 基板处理方法和基板处理装置
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Application No.: US11882398Application Date: 2007-08-01
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Publication No.: US07767472B2Publication Date: 2010-08-03
- Inventor: Atsushi Shigeta , Gen Toyota , Hiroyuki Yano , Kunio Oishi , Kenya Ito , Masayuki Nakanishi , Kenji Yamaguchi
- Applicant: Atsushi Shigeta , Gen Toyota , Hiroyuki Yano , Kunio Oishi , Kenya Ito , Masayuki Nakanishi , Kenji Yamaguchi
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Ebara Corporation,Kabushiki Kaisha Toshiba
- Current Assignee: Ebara Corporation,Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2004-217572 20040726
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A substrate processing method is used to polish a substrate. The substrate processing method includes rotating a substrate 13 by a motor 12, polishing a first surface of a peripheral portion of the substrate 13 by pressing a polishing surface of a polishing mechanism 20 against the first surface, determining a polishing end point of the first surface by monitoring a polished state of the first surface, stopping the polishing according to the determining the polishing end point, determining a polishing time spent for the polishing, determining a polishing time for a second surface of the peripheral portion based on the polishing time of the first surface, and polishing the second surface for the determined polishing time.
Public/Granted literature
- US20070287364A1 Substrate processing method and substrate processing apparatus Public/Granted day:2007-12-13
Information query
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