A method for locating a device, which produces a field, with a probe assembly affected by the field. The method may involve: placing a device on a first side of a work piece; producing a field with the device through the work piece; using a robot to hold and to place a probe assembly adjacent a second side of the work piece; providing information from the probe assembly to the robot that is used by the robot to move the probe assembly to substantially determine a position of the device; determining a location of a center field axis of the field with the probe assembly; and providing a physical confirmation of the center field axis to a user.