Invention Grant
- Patent Title: Image pickup apparatus using an imaging unit including an etalon and calibration method therefor
- Patent Title (中): 使用包括标准具的成像单元及其校正方法的摄像装置
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Application No.: US11113123Application Date: 2005-04-25
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Publication No.: US07768570B2Publication Date: 2010-08-03
- Inventor: Akira Hasegawa
- Applicant: Akira Hasegawa
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Arnold International
- Agent Bruce Y. Arnold
- Priority: JP2004-129782 20040426
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N17/00 ; H04N7/18

Abstract:
An image pickup apparatus includes an objective optical system, an image pickup element having a surface at an image formed by the objective optical system, and an etalon positioned between the objective optical system and the surface of the image pickup element. The etalon includes a gap, an optical path length of which is controllable for scanning the wavelengths transmitted by the etalon to thereby select the wavelengths that reach the surface. An optical filter is positioned between the objective optical system and the surface and has a first wavelength range over which incident light is reflected, a second wavelength range over which incident light is transmitted, and a boundary wavelength range that is bounded by the first and second wavelength ranges. The boundary wavelength range lies entirely within the wavelength range the peak transmission of the etalon can be scanned. A method of calibrating the etalon is also disclosed.
Public/Granted literature
- US20050237416A1 Image pickup apparatus using an imaging unit including an etalon and calibration method therefor Public/Granted day:2005-10-27
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