Invention Grant
US07768639B1 Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry
有权
电感耦合等离子体原子发射光谱法检测和校正不准确结果的方法
- Patent Title: Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry
- Patent Title (中): 电感耦合等离子体原子发射光谱法检测和校正不准确结果的方法
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Application No.: US12212915Application Date: 2008-09-18
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Publication No.: US07768639B1Publication Date: 2010-08-03
- Inventor: George C. Y. Chan , Gary M. Hieftje
- Applicant: George C. Y. Chan , Gary M. Hieftje
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the United States Department of Energy
- Current Assignee: The United States of America as represented by the United States Department of Energy
- Current Assignee Address: US DC Washington
- Agent Michael J. Dobbs; Daniel D. Park
- Main IPC: G01N21/73
- IPC: G01N21/73

Abstract:
A method for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry (ICP-AES). ICP-AES analysis is performed across a plurality of selected locations in the plasma on an unknown sample, collecting the light intensity at one or more selected wavelengths of one or more sought-for analytes, creating a first dataset. The first dataset is then calibrated with a calibration dataset creating a calibrated first dataset curve. If the calibrated first dataset curve has a variability along the location within the plasma for a selected wavelength, errors are present. Plasma-related errors are then corrected by diluting the unknown sample and performing the same ICP-AES analysis on the diluted unknown sample creating a calibrated second dataset curve (accounting for the dilution) for the one or more sought-for analytes. The cross-over point of the calibrated dataset curves yields the corrected value (free from plasma related errors) for each sought-for analyte.
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