发明授权
US07768639B1 Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry
有权
电感耦合等离子体原子发射光谱法检测和校正不准确结果的方法
- 专利标题: Methods for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry
- 专利标题(中): 电感耦合等离子体原子发射光谱法检测和校正不准确结果的方法
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申请号: US12212915申请日: 2008-09-18
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公开(公告)号: US07768639B1公开(公告)日: 2010-08-03
- 发明人: George C. Y. Chan , Gary M. Hieftje
- 申请人: George C. Y. Chan , Gary M. Hieftje
- 申请人地址: US DC Washington
- 专利权人: The United States of America as represented by the United States Department of Energy
- 当前专利权人: The United States of America as represented by the United States Department of Energy
- 当前专利权人地址: US DC Washington
- 代理商 Michael J. Dobbs; Daniel D. Park
- 主分类号: G01N21/73
- IPC分类号: G01N21/73
摘要:
A method for detecting and correcting inaccurate results in inductively coupled plasma-atomic emission spectrometry (ICP-AES). ICP-AES analysis is performed across a plurality of selected locations in the plasma on an unknown sample, collecting the light intensity at one or more selected wavelengths of one or more sought-for analytes, creating a first dataset. The first dataset is then calibrated with a calibration dataset creating a calibrated first dataset curve. If the calibrated first dataset curve has a variability along the location within the plasma for a selected wavelength, errors are present. Plasma-related errors are then corrected by diluting the unknown sample and performing the same ICP-AES analysis on the diluted unknown sample creating a calibrated second dataset curve (accounting for the dilution) for the one or more sought-for analytes. The cross-over point of the calibrated dataset curves yields the corrected value (free from plasma related errors) for each sought-for analyte.
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