Invention Grant
- Patent Title: Methods and system for measuring an object
- Patent Title (中): 测量物体的方法和系统
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Application No.: US11642076Application Date: 2006-12-20
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Publication No.: US07768655B2Publication Date: 2010-08-03
- Inventor: Steven Robert Hayashi , Zhongguo Li , Kevin George Harding , Jianming Zheng , Howard Paul Weaver , Xiaoming Du , Tian Chen
- Applicant: Steven Robert Hayashi , Zhongguo Li , Kevin George Harding , Jianming Zheng , Howard Paul Weaver , Xiaoming Du , Tian Chen
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Armstrong Teasdale LLP
- Agent William Scott Andes, Esq.
- Main IPC: G01B11/24
- IPC: G01B11/24
Abstract:
A method of measuring an object includes positioning the object on a moveable stage, performing a rotary scan of the object with a range sensor, and determining geometric parameters of the object based on the rotary scan.
Public/Granted literature
- US20080148590A1 Methods and system for measuring an object Public/Granted day:2008-06-26
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