发明授权
- 专利标题: Photo detector and optically interconnected LSI
- 专利标题(中): 光电检测器和光互连LSI
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申请号: US11610151申请日: 2006-12-13
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公开(公告)号: US07768689B2公开(公告)日: 2010-08-03
- 发明人: Hideto Furuyama
- 申请人: Hideto Furuyama
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-069535 20060314
- 主分类号: G02B26/08
- IPC分类号: G02B26/08
摘要:
A photo detector having an electrically conductive thin film and a light-receiving unit. A coupling periodic structure is provided on a surface of the film and converts incidence light to surface plasmon. The coupling periodic structure has an opening that penetrates the obverse and reverse surfaces of the thin film. The light-receiving unit is provided at one end of the opening in the surface that is opposite to the surface on which the coupling periodic structure is provided. The opening is shaped like a slit and is broader than half (½) the wavelength of the surface plasmon in a direction that intersects at right angles with a polarization direction of the incidence light and is narrower than half (½) the wavelength of the surface plasmon in a direction parallel to the polarization direction.
公开/授权文献
- US20070262405A1 PHOTO DETECTOR AND OPTICALLY INTERCONNECTED LSI 公开/授权日:2007-11-15