Invention Grant
- Patent Title: Leakage current protection circuit
- Patent Title (中): 漏电保护电路
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Application No.: US11741520Application Date: 2007-04-27
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Publication No.: US07768756B2Publication Date: 2010-08-03
- Inventor: Wei-Han Huang , Anys Bacha
- Applicant: Wei-Han Huang , Anys Bacha
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H02H3/24
- IPC: H02H3/24 ; H02J9/00 ; H02J1/00

Abstract:
Systems and methods are provided for substantially mitigating leakage current. One embodiment includes an integrated circuit (IC). The IC comprises a monitoring circuit configured to control switching of one of a first voltage source and a second voltage source to an output. The IC also comprises a leakage current protection circuit configured to substantially mitigate leakage current flow between the first voltage source and the second voltage source due to an undershoot condition caused by the switching between the first and second voltage sources to the output.
Public/Granted literature
- US20080265682A1 LEAKAGE CURRENT PROTECTION CIRCUIT Public/Granted day:2008-10-30
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