Invention Grant
US07768812B2 Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices 有权
存储单元,存储单元编程方法,存储单元读取方法,存储单元操作方法和存储器件

  • Patent Title: Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices
  • Patent Title (中): 存储单元,存储单元编程方法,存储单元读取方法,存储单元操作方法和存储器件
  • Application No.: US12014232
    Application Date: 2008-01-15
  • Publication No.: US07768812B2
    Publication Date: 2010-08-03
  • Inventor: Jun Liu
  • Applicant: Jun Liu
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: Wells St. John, P.S.
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices
Abstract:
Embodiments disclosed include memory cell operating methods, memory cell programming methods, memory cell reading methods, memory cells, and memory devices. In one embodiment, a memory cell includes a wordline, a first bitline, a second bitline, and a memory element. The memory element is electrically connected to the wordline and selectively electrically connected to the first bitline and the second bitline. The memory element stores information via a resistive state of the memory element. The memory cell is configured to convey the resistive state of the memory element via either a first current flowing from the first bitline through the memory element to the wordline or a second current flowing from the wordline through the memory element to the second bitline.
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