Invention Grant
US07768812B2 Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices
有权
存储单元,存储单元编程方法,存储单元读取方法,存储单元操作方法和存储器件
- Patent Title: Memory cells, memory cell programming methods, memory cell reading methods, memory cell operating methods, and memory devices
- Patent Title (中): 存储单元,存储单元编程方法,存储单元读取方法,存储单元操作方法和存储器件
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Application No.: US12014232Application Date: 2008-01-15
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Publication No.: US07768812B2Publication Date: 2010-08-03
- Inventor: Jun Liu
- Applicant: Jun Liu
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John, P.S.
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
Embodiments disclosed include memory cell operating methods, memory cell programming methods, memory cell reading methods, memory cells, and memory devices. In one embodiment, a memory cell includes a wordline, a first bitline, a second bitline, and a memory element. The memory element is electrically connected to the wordline and selectively electrically connected to the first bitline and the second bitline. The memory element stores information via a resistive state of the memory element. The memory cell is configured to convey the resistive state of the memory element via either a first current flowing from the first bitline through the memory element to the wordline or a second current flowing from the wordline through the memory element to the second bitline.
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