发明授权
- 专利标题: Electromagnetic wave generation source searching method and current probe used therefor
- 专利标题(中): 电磁波发生源搜索方法及其电流探头
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申请号: US11502435申请日: 2006-08-11
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公开(公告)号: US07772856B2公开(公告)日: 2010-08-10
- 发明人: Hiroki Funato , Takashi Suga
- 申请人: Hiroki Funato , Takashi Suga
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2005-271318 20050920
- 主分类号: G01R27/08
- IPC分类号: G01R27/08
摘要:
A junction-current probe is provided which can measure a current flowing in a junction port adapted to connect a circuit board or an electronic apparatus to a chassis under the condition that the circuit board or electronic apparatus is packaged to the chassis. Structurally, the current probe has a circular or rectangular insulator having a hole in the center, a coiled conductor wire for converting linkage flux into voltage, an insulating member for preventing the insulator from making electrical contact with surroundings, an extraction lead for connecting opposite ends of the conductor wire to a cable and the cable for connection to a measurement unit. The current probe is reduced in thickness within in a range in which the condition of packaging to the chassis can remain unchanged.
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