发明授权
US07773918B2 Imaging apparatus having particle supply and collection apparatus arranged outside imaging apparatus
有权
具有设置在成像装置外部的颗粒供给和收集装置的成像装置
- 专利标题: Imaging apparatus having particle supply and collection apparatus arranged outside imaging apparatus
- 专利标题(中): 具有设置在成像装置外部的颗粒供给和收集装置的成像装置
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申请号: US12354344申请日: 2009-01-15
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公开(公告)号: US07773918B2公开(公告)日: 2010-08-10
- 发明人: Hiroshi Sano , Hirosato Amano , Keizo Chiba , Tetsuo Noji , Hiroshi Tateishi , Kazuhisa Sudo , Fumihito Itoh
- 申请人: Hiroshi Sano , Hirosato Amano , Keizo Chiba , Tetsuo Noji , Hiroshi Tateishi , Kazuhisa Sudo , Fumihito Itoh
- 申请人地址: JP Tokyo
- 专利权人: Ricoh Company, Ltd.
- 当前专利权人: Ricoh Company, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2005-291464 20051004; JP2006-041350 20060217; JP2006-049445 20060227; JP2006-121395 20060426; JP2006-121488 20060426
- 主分类号: G03G15/08
- IPC分类号: G03G15/08
摘要:
A particle supply apparatus is disclosed that includes a particle accommodating unit that accommodates particles, a gas spouting unit that is arranged at a bottom portion of the particle accommodating unit and is configured to spout gas toward the particles, a conveying mechanism that applies suction to the particles accommodated in the particle accommodating unit and conveys the particles toward a supply destination, and a gas discharge unit that discharges gas contained within the particle accommodating unit toward an exterior side of the particle accommodating unit.
公开/授权文献
- US20090129838A1 PARTICLE SUPPLY APPARATUS AND IMAGING APPARATUS 公开/授权日:2009-05-21
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