发明授权
- 专利标题: Position measurement system
- 专利标题(中): 位置测量系统
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申请号: US12458867申请日: 2009-07-24
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公开(公告)号: US07791736B2公开(公告)日: 2010-09-07
- 发明人: Yasuji Seko , Yoshinori Yamaguchi , Yasuyuki Saguchi
- 申请人: Yasuji Seko , Yoshinori Yamaguchi , Yasuyuki Saguchi
- 申请人地址: JP Tokyo
- 专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人: Fuji Xerox Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2005-358687 20051213
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.
公开/授权文献
- US20090310142A1 Position measurement system 公开/授权日:2009-12-17
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