发明授权
- 专利标题: Instruments for measuring nanoparticle exposure
- 专利标题(中): 用于测量纳米颗粒暴露的仪器
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申请号: US11439451申请日: 2006-05-23
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公开(公告)号: US07812306B2公开(公告)日: 2010-10-12
- 发明人: Heinz Fissan , Andreas Trampe , David Y. H. Pui , Stanley L. Kaufman
- 申请人: Heinz Fissan , Andreas Trampe , David Y. H. Pui , Stanley L. Kaufman
- 申请人地址: US MN Shoreview
- 专利权人: TSI, Incorporated
- 当前专利权人: TSI, Incorporated
- 当前专利权人地址: US MN Shoreview
- 代理机构: Patterson Thuente Christensen Pedersen, P.A.
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
An instrument for non-invasively measuring nanoparticle exposure includes a corona discharge element generating ions to effect unipolar diffusion charging of an aerosol, followed by an ion trap for removing excess ions and a portion of the charged particles with electrical mobilities above a threshold. Downstream, an electrically conductive HEPA filter or other collecting element accumulates the charged particles and provides the resultant current to an electrometer amplifier. The instrument is tunable to alter the electrometer amplifier output toward closer correspondence with a selected function describing particle behavior, e.g. nanoparticle deposition in a selected region of the respiratory system. Tuning entails adjusting voltages applied to one or more of the ion trap, the corona discharge element and the collecting element. Alternatively, tuning involves adjusting the aerosol flow rate, either directly or in comparison to the flow rate of a gas conducting the ions toward merger with the aerosol.
公开/授权文献
- US20060284077A1 Instruments for measuring nanoparticle exposure 公开/授权日:2006-12-21
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