发明授权
US07817456B2 Program lock circuit for a mask programmable anti-fuse memory array
有权
用于掩模可编程反熔丝存储器阵列的程序锁定电路
- 专利标题: Program lock circuit for a mask programmable anti-fuse memory array
- 专利标题(中): 用于掩模可编程反熔丝存储器阵列的程序锁定电路
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申请号: US12306260申请日: 2007-12-20
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公开(公告)号: US07817456B2公开(公告)日: 2010-10-19
- 发明人: Wlodek Kurjanowicz
- 申请人: Wlodek Kurjanowicz
- 申请人地址: CA Ottawa, Ontario
- 专利权人: Sidense Corp.
- 当前专利权人: Sidense Corp.
- 当前专利权人地址: CA Ottawa, Ontario
- 代理机构: Borden Ladner Gervais LLP
- 代理商 Shin Hung
- 国际申请: PCT/CA2007/002286 WO 20071220
- 国际公布: WO2008/077239 WO 20080703
- 主分类号: G11C17/00
- IPC分类号: G11C17/00
摘要:
A program lock circuit for inhibiting programming of memory cells. A memory array can have both mask programmable and one-time programmable memory cells connected to the wordlines and the bitlines. Since the one-time programmable memory cells are convertible into mask programmable memory cells through mask programming, such as diffusion mask programming or contact/via mask programming, these mask programmed cells are still electrically programmable, thereby destroying the originally stored data. The programming lock circuit inhibits programming of the mask programmed cells by detecting an activated wordline during a programming operation, and then immediately disabling or decoupling the high voltage supply that is provided to the wordline drivers. Mask programmed transistor elements coupled to each wordline detect the wordline voltage and disable the high voltage supply. A mask programmable master lock device can be provided to inhibit all the rows in the memory array from being programmed.
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