发明授权
- 专利标题: Insulated gate field effect semiconductor devices and method of manufacturing the same
- 专利标题(中): 绝缘栅场效应半导体器件及其制造方法
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申请号: US12277547申请日: 2008-11-25
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公开(公告)号: US07821011B2公开(公告)日: 2010-10-26
- 发明人: Shunpei Yamazaki , Yasuhiko Takemura , Hongyong Zhang
- 申请人: Shunpei Yamazaki , Yasuhiko Takemura , Hongyong Zhang
- 申请人地址: JP Kanagawa-Ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-Ken
- 代理机构: Nixon Peabody LLP
- 代理商 Jeffrey L. Costellia
- 优先权: JP1991-238713 19910826; JP1992-030220 19920121
- 主分类号: H01L33/00
- IPC分类号: H01L33/00
摘要:
An LDD structure is manufactured to have a desired aspect ratio of the height to the width of a gate electrode. The gate electrode is first deposited on a semiconductor substrate followed by ion implantation with the gate electrode as a mask to form a pair of impurity regions. The gate electrode is then anodic oxidized to form an oxide film enclosing the electrode. With the oxide film as a mask, highly doped regions are formed by ion implantation in order to define lightly doped regions between the highly doped regions and the channel region located therebetween.
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