Invention Grant
US07826052B2 Correction method and measurement device for anti-stokes photoluminescence measurement
有权
反斯托克斯光致发光测量的校正方法和测量装置
- Patent Title: Correction method and measurement device for anti-stokes photoluminescence measurement
- Patent Title (中): 反斯托克斯光致发光测量的校正方法和测量装置
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Application No.: US11915316Application Date: 2006-05-24
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Publication No.: US07826052B2Publication Date: 2010-11-02
- Inventor: Ville Haaslahti , Juhani Aalto , Timo Oikari , Tero Soukka
- Applicant: Ville Haaslahti , Juhani Aalto , Timo Oikari , Tero Soukka
- Applicant Address: FI Turku
- Assignee: Hidex Oy
- Current Assignee: Hidex Oy
- Current Assignee Address: FI Turku
- Agent James C. Lydon
- Priority: FI20050551 20050524
- International Application: PCT/FI2006/000164 WO 20060524
- International Announcement: WO2006/125855 WO 20061130
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A method to correct measurement error in a resonance energy-transfer assay, including exciting anti-Stokes photoluminescent donors with at least one wavelength of light which is greater than an emission wavelength of acceptor molecules; measuring emission at the acceptor's emission wavelength and which differs from the donor's emission wavelength in at least two different time windows; a first time window within the time window defined by the excitation light pulse and a second non-overlapping time window which follows the first time window; and correcting the emission signal, which includes signals originating from non-radiative and radiative energy transfer, within the first time window by estimating the ratio of the signals from non-radiative and radiative energy transfer or the signal originating from radiative energy transfer using at least one emission signal measured in the second time window.
Public/Granted literature
- US20080174766A1 Correction Method and Measurement Device For Anti-Stokes Photoluminescence Measurement Public/Granted day:2008-07-24
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