发明授权
- 专利标题: Plasma processing method and plasma processing apparatus
- 专利标题(中): 等离子体处理方法和等离子体处理装置
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申请号: US11694126申请日: 2007-03-30
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公开(公告)号: US07829463B2公开(公告)日: 2010-11-09
- 发明人: Naoki Matsumoto , Chishio Koshimizu , Manabu Iwata , Satoshi Tanaka
- 申请人: Naoki Matsumoto , Chishio Koshimizu , Manabu Iwata , Satoshi Tanaka
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-092939 20060330
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
A plasma processing method performs a desired plasma process on substrates by using a plasma generated in a processing space. A first and a second electrode are disposed in parallel in a processing vessel that is grounded, the substrate is supported on the second electrode to face the first electrode, the processing vessel is vacuum evacuated, a desired processing gas is supplied into the processing space formed between the first electrode, the second electrode and a sidewall of the processing vessel, and a first radio frequency power is supplied to the second electrode. The first electrode is connected to the processing vessel via an insulator or a space, and is electrically coupled to a ground potential via a capacitance varying unit whose electrostatic capacitance is varied based on a process condition of the plasma process performed on the substrate.
公开/授权文献
- US20070227665A1 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS 公开/授权日:2007-10-04
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