发明授权
- 专利标题: Sealed structure and method of fabricating sealed structure and semiconductor device and method of fabricating semiconductor device
- 专利标题(中): 密封结构和密封结构的制造方法及半导体器件及其制造方法
-
申请号: US11624440申请日: 2007-01-18
-
公开(公告)号: US07834438B2公开(公告)日: 2010-11-16
- 发明人: Akinori Shiraishi , Naoyuki Koizumi , Kei Murayama , Hideaki Sakaguchi , Masahiro Sunohara , Yuichi Taguchi , Mitsutoshi Higashi
- 申请人: Akinori Shiraishi , Naoyuki Koizumi , Kei Murayama , Hideaki Sakaguchi , Masahiro Sunohara , Yuichi Taguchi , Mitsutoshi Higashi
- 申请人地址: JP Nagano-shi
- 专利权人: Shinko Electric Industries Co., Ltd.
- 当前专利权人: Shinko Electric Industries Co., Ltd.
- 当前专利权人地址: JP Nagano-shi
- 代理机构: Rankin, Hill & Clark LLP
- 优先权: JP2006-019286 20060127
- 主分类号: H01L23/06
- IPC分类号: H01L23/06
摘要:
According to a sealed structure 60 constituted by anodically bonding a silicon board 20 and a glass plate 40, an upper opening of a recessed portion 22 is sealed in an airtight state by the glass plate 40 by bonding an upper face of a wall portion 26 to the glass plate 40. A voltage applying pattern 70 is formed to surround a light transmitting region to which an optical conversion element 24 is opposed. Further, the voltage applying pattern 70 functions as a cathode pattern applied with a voltage by being brought into contact with a lower face of the cathode plate 50.
公开/授权文献
信息查询
IPC分类: