发明授权
- 专利标题: Locking state detector and DLL circuit having the same
- 专利标题(中): 具有相同的锁定状态检测器和DLL电路
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申请号: US12263300申请日: 2008-10-31
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公开(公告)号: US07839190B2公开(公告)日: 2010-11-23
- 发明人: Dong-Suk Shin , Chul Woo Kim , Hyun Soo Chae
- 申请人: Dong-Suk Shin , Chul Woo Kim , Hyun Soo Chae
- 申请人地址: KR KR
- 专利权人: Hynix Semiconductor Inc.,Korea University Industrial & Academic Collaboration Foundation
- 当前专利权人: Hynix Semiconductor Inc.,Korea University Industrial & Academic Collaboration Foundation
- 当前专利权人地址: KR KR
- 代理机构: Baker & McKenzie LLP
- 优先权: KR10-2008-0013466 20080214
- 主分类号: H03L7/06
- IPC分类号: H03L7/06
摘要:
A locking state detector includes a phase comparing unit configured to compare a reference clock signal and a feedback clock signal to generate a first phase difference distinction signal to distinguish a first phase difference range, and a second phase difference distinction signal to distinguish a second phase difference range wider than the first phase difference range, and a locking state setting unit configured to generate a locking state signal in response to the first phase difference distinction signal and the second phase difference distinction signal.
公开/授权文献
- US20090206884A1 LOCKING STATE DETECTOR AND DLL CIRCUIT HAVING THE SAME 公开/授权日:2009-08-20
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