Invention Grant
- Patent Title: Semiconductor device and data outputting method of the same
- Patent Title (中): 半导体装置及其数据输出方法
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Application No.: US12130666Application Date: 2008-05-30
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Publication No.: US07839200B2Publication Date: 2010-11-23
- Inventor: Jae-Hyuk Im , Kee-Teok Park
- Applicant: Jae-Hyuk Im , Kee-Teok Park
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2007-0137401 20071226
- Main IPC: G05F1/10
- IPC: G05F1/10
Abstract:
Semiconductor device and data outputting method of the same includes an on die thermal sensor (ODTS) configured to output temperature information by detecting an internal temperature of the semiconductor device and an output driver configured to control a slew rate depending on the temperature information and output data.
Public/Granted literature
- US20090167413A1 SEMICONDUCTOR DEVICE AND DATA OUTPUTTING METHOD OF THE SAME Public/Granted day:2009-07-02
Information query
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