发明授权
US07852960B2 Method of computing path metrics in a high-speed Viterbi detector and related apparatus thereof
有权
在高速维特比检测器及其相关装置中计算路径度量的方法
- 专利标题： Method of computing path metrics in a high-speed Viterbi detector and related apparatus thereof
- 专利标题（中）： 在高速维特比检测器及其相关装置中计算路径度量的方法
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申请号： US11161202申请日： 2005-07-26
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公开(公告)号： US07852960B2公开(公告)日： 2010-12-14
- 发明人: Wen-Yi Wu , Meng-Ta Yang , Pi-Hai Liu
- 申请人： Wen-Yi Wu , Meng-Ta Yang , Pi-Hai Liu
- 申请人地址： TW Science-Based Industrial Park, Hsin-Chu Hsien
- 专利权人： Mediatek Incorporation
- 当前专利权人： Mediatek Incorporation
- 当前专利权人地址： TW Science-Based Industrial Park, Hsin-Chu Hsien
- 代理商 Winston Hsu; Scott Margo
- 优先权： TW93132017A 20041021
- 主分类号： H04L5/12
- IPC分类号： H04L5/12
摘要：
A path metric computing method applied in a high-speed Viterbi detector and related apparatus thereof are disclosed. The path metric computing apparatus includes a comparator for generating a control signal according a plurality of previous path metrics, a combining circuit for generating a plurality of first output values according to the previous path metrics and branch costs of a plurality of branches of a current state, and a multiplexer, electrically connected to the comparator and the combining circuit, for determining a first path metric of the current state according to the control signal and the output values.
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