发明授权
- 专利标题: Method of specimen analysis and specimen analyzer
- 专利标题(中): 标本分析方法和标本分析仪
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申请号: US11864855申请日: 2007-09-28
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公开(公告)号: US07854891B2公开(公告)日: 2010-12-21
- 发明人: Norimasa Yamamoto , Naohiko Matsuo
- 申请人: Norimasa Yamamoto , Naohiko Matsuo
- 申请人地址: JP Hyogo
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP Hyogo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2005-093632 20050329
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
A novel method of specimen analysis in which prior to specimen analysis, any interfering substance can be measured. There is provided a method of specimen analysis, comprising the steps of irradiating a specimen with light to thereby obtain an optical information on the specimen from the specimen; mixing the specimen with a reagent to thereby obtain an analytical sample; and irradiating the analytical sample with light to thereby obtain an optical information on the sample from the analytical sample and processing the optical information on the sample to thereby accomplish analysis of the analytical sample. In the step of the analysis of the analytical sample, analytical conditions commensurate with the analytical sample are set on the basis of the optical information on the specimen.
公开/授权文献
- US20080070318A1 METHOD OF SPECIMEN ANALYSIS AND SPECIMEN ANALYZER 公开/授权日:2008-03-20
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