发明授权
- 专利标题: Dimension measuring apparatus
- 专利标题(中): 尺寸测量仪器
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申请号: US12389288申请日: 2009-02-19
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公开(公告)号: US07855790B2公开(公告)日: 2010-12-21
- 发明人: Norihiko Nishizawa , Masatoshi Arai , Tomohiro Aoto
- 申请人: Norihiko Nishizawa , Masatoshi Arai , Tomohiro Aoto
- 申请人地址: JP Osaka JP Aichi-ken JP Tokyo
- 专利权人: Osaka University,National University Corporation Nagoya University,Tokyo Seimitsu Co., Ltd.
- 当前专利权人: Osaka University,National University Corporation Nagoya University,Tokyo Seimitsu Co., Ltd.
- 当前专利权人地址: JP Osaka JP Aichi-ken JP Tokyo
- 代理机构: Christie, Parker & Hale LLP
- 优先权: JP2008-038151 20080220; JP2008-334517 20081226
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
A dimension measuring apparatus includes a light beam splitting element for splitting light emitted from a white light source into measuring light flux and reference light flux, a reference light scanning optics for varying optical path length of the reference light flux, a detector for detecting interference signal produced by the light fluxes, and a controller for determining the surface height of the object from the optical path length of the reference light flux corresponding to maximum value of the interference signal. The reference light scanning optics includes a rotary member, first and second reflective elements disposed to be symmetrical with respect to the rotation axis of the rotary member, and light beam deflecting members that direct the reference light flux to be incident on the first reflective element along the direction parallel and opposite to the incident direction of the reference light flux on the second reflective element.
公开/授权文献
- US20090237675A1 DIMENSION MEASURING APPARATUS 公开/授权日:2009-09-24
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