发明授权
- 专利标题: Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices
- 专利标题(中): 使用荧光纳米颗粒来测量多层膜中的单层厚度或组成,并校准二次测量装置
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申请号: US12125932申请日: 2008-05-23
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公开(公告)号: US07858953B2公开(公告)日: 2010-12-28
- 发明人: Michael Kon Yew Hughes , Sebastien Tixier
- 申请人: Michael Kon Yew Hughes , Sebastien Tixier
- 申请人地址: CA Mississauga
- 专利权人: Honeywell ASCa Inc.
- 当前专利权人: Honeywell ASCa Inc.
- 当前专利权人地址: CA Mississauga
- 代理机构: Cascio Schmoyer & Zervas
- 主分类号: G01N21/64
- IPC分类号: G01N21/64
摘要:
Fluorescent nanoparticles such as quantum dots are incorporated into plastic, paper and other web layered products to achieve cross-direction and machine direction on-line analysis of the individual layers therein. Fluorescent nanoparticles markers are added in known proportions into product formulations. By detecting the fluorescence from the nanoparticles, the thickness and other physical characteristics of the web can be traced at various stages of production. In addition, by using different populations of fluorescent nanoparticles that emit radiation at different wavelengths, data from individual layers in a composite structure can be ascertained simultaneously with a single sensor. The technique is particularly suited for monitoring difficult-to-measure polymers in complex multilayer structures.
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