发明授权
US07858953B2 Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices 有权
使用荧光纳米颗粒来测量多层膜中的单层厚度或组成,并校准二次测量装置

Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices
摘要:
Fluorescent nanoparticles such as quantum dots are incorporated into plastic, paper and other web layered products to achieve cross-direction and machine direction on-line analysis of the individual layers therein. Fluorescent nanoparticles markers are added in known proportions into product formulations. By detecting the fluorescence from the nanoparticles, the thickness and other physical characteristics of the web can be traced at various stages of production. In addition, by using different populations of fluorescent nanoparticles that emit radiation at different wavelengths, data from individual layers in a composite structure can be ascertained simultaneously with a single sensor. The technique is particularly suited for monitoring difficult-to-measure polymers in complex multilayer structures.
信息查询
0/0